X-ray product quality automatic inspection device

ABSTRACT

An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to PCT Application No.PCT/CN2015/088258, filed Aug. 27, 2015, published as WO 2016/034073A1,entitled “X-Ray Product Quality Automatic Inspection Device” and ChinesePatent Application No. 201410442128.3, filed on Sep. 2, 2014, publishedas CN105372269A, which are hereby incorporated by reference in theirentirety.

FIELD OF THE INVENTION

The present invention relates to a device for performing qualityinspection on factory line products by use of X-ray, particularlyrelating to a device for performing a three-dimensional imaginginspection on products on production line by use of a distributed X-raysource.

BACKGROUND

X-ray sources are widely used in fields of industrial nondestructivetesting, security check, medical diagnosis and treatment, etc. It ispossible to analyze a fine structure of an object by transmissionimaging of the object using a high penetration capability of X-rays.Thus, the purposes of structural analysis, defect inspection, effectverification, etc., for example, production quality inspection of theproducts on production line, can be achieved. Traditional X-ray sourcehas only one target, that is, generating the X-rays from only oneposition. A new type of X-ray source, known as distributed X-ray sourcecan generate X-rays from different positions.

Further, the X-ray sources have been applied to perform on-lineinspection to industrial products on factory lines, such as electroniccomponents, circuit boards, mechanical parts, metal cans, lithium ionbatteries, glass bottles, metal defects and the like.

Patent Document 1 and the like use a traditional X-ray source withsingle target, and usually can achieve transmission imaging of theproducts on production lines in only one direction. Patent Document 2and the like rotate an inspected product by 360 degree via an auxiliarydevice and continuously image the inspected product during the rotation,and thus achieving an “all-round” inspection. Patent Document 3 and thelike perform multiple transmission imaging on a same product when it islocated at different positions, and obtain a three-dimensional image byusing “an iterative reconstruction algorithm of translation-typecone-beam CT based on sub-region equalization and total variationminimization”. Patent Document 4 and the like use a plurality of X-raysources to perform transmission imaging on the inspected products fromdifferent angles.

-   Patent Document 1: CN103698346A;-   Patent Document 2: CN103644935A;-   Patent Document 3: CN102590248A; and-   Patent Document 4: CN202814895U.

SUMMARY OF THE INVENTION

An aspect of the present application provides an X-ray product qualityautomatic inspection device, which uses a distributed X-ray source toperform a multiple-angle quick imaging on a product, thereby obtaining amulti-view image or a three-dimensional image of the inspected product.Further, it is possible to automatically perform an all-round qualityanalysis on the product through a software system, and to execute asorting according to the analysis result.

An aspect of the present application provides an X-ray product qualityautomatic inspection device, which comprises:

-   a distributed X-ray source having a plurality of targets, wherein    the distributed X-ray source is able to generate X-rays for    irradiating an inspected product, from the plurality of targets in a    predetermined sequence;-   a detector for receiving the X-rays generated by the distributed    X-ray source and outputting a signal representing characteristics of    the received X-rays;-   a transport device for carrying the inspected product to pass    through an X-ray radiation region; and-   a power supply and control device, which is used to supply power to    and control the X-ray product quality automatic inspection device,    to form characteristic information of the inspected product    according to the signal from the detector, and to provide an    inspection and analysis result of the inspected product according to    the characteristic information.

Further, the X-ray product quality automatic inspection device of thepresent application has a sorting device, which is located downstream ofthe distributed X-ray source and the detector in a moving direction ofthe inspected product, and is used to sort the inspected productaccording to the signal from the detector or the inspection and analysisresult from the power supply and control device.

Further, in the X-ray product quality automatic inspection device of thepresent application, the transport device is a part of a factoryproduction line.

Further, in the X-ray product quality automatic inspection device of thepresent application, the transport device is located between thedistributed X-ray source and the detector, and is arranged as acontinuous transport mechanism which matches a production line for theinspected product.

Further, in the X-ray product quality automatic inspection device of thepresent application, the transport device is interposed into a factorystandard production line, and the inspected product is transported froman upstream standard production line to the transport device, whichcarries the inspected product to pass through the X-ray radiation regionand then transports the inspected product onto a downstream standardproduction line.

Further, in the X-ray product quality automatic inspection device of thepresent application, the power supply and control device determineswhether the signal from the detector falls within a predeterminedthreshold range, and the sorting device sorts out the inspected productwhen it is determined that the signal from the detector does not fallwithin the threshold range.

Further, in the X-ray product quality automatic inspection device of thepresent application, the sorting device sorts out the inspected productin a case where the inspection and analysis result from the power supplyand control device indicates that the characteristic information of theinspected product is inconsistent with standard characteristicinformation.

Further, in the X-ray product quality automatic inspection device of thepresent application, the power supply and control device furthercomprises an image construction subsystem, which is used to receive thesignal from the detector and to form a multi-view image or a3-dimensional image expressing the characteristic information of theinspected product.

Further, in the X-ray product quality automatic inspection device of thepresent application, the power supply and control device furthercomprises an image analysis subsystem, which is used to compare andanalyze the inspected image obtained by the image construction subsystemand an image of a standard product according to a predetermined rule,and the inspected product is sorted according to the comparison andanalysis result of the image analysis subsystem.

Further, in the X-ray product quality automatic inspection device of thepresent application, the power supply and control device furthercomprises a display and operation subsystem for displaying at least oneof: operating state of the X-ray product quality automatic inspectiondevice, an inspection image of the inspected product, the inspection andanalysis result, and inputting of control instructions.

Further, the X-ray product quality automatic inspection device of thepresent application further comprises a shielding device, which enclosesthe X-ray radiation region and shields stray X-rays.

Further, in the X-ray product quality automatic inspection device of thepresent application, the plurality of targets of the distributed X-raysource are arranged in straight line, polyline, arc or the combinationthereof.

Further, in the X-ray product quality automatic inspection device of thepresent application, an arrangement direction of the plurality oftargets of the distributed X-ray source is perpendicular to the movingdirection of the inspected product, or the plurality of targets of thedistributed X-ray source are arranged in an arc shape or a spiral shapealong the moving direction of the inspected product.

Further, in the X-ray product quality automatic inspection device of thepresent application, the detector is a flat panel detector havingnumerous detection units or a detector having a plurality of detectionunits in a one-dimensional linear array or a two-dimensional matrixarray, and is able to receive the X-rays at a plurality of positions atthe same time.

Further, in the X-ray product quality automatic inspection device of thepresent application, a sum of a field angle of the X-rays from thedistributed X-ray source to any point on the inspected product and afield angle of the X-rays from the point to the detector is more than180 degrees.

Further, in the X-ray product quality automatic inspection device of thepresent application, the distributed X-ray source is a dual-energy X-raysource and/or the detector is a dual-energy detector.

As described above, an aspect of the present application provides anX-ray product quality automatic inspection device comprising adistributed X-ray source, a detector, a transport device, a power supplyand control device, a sorting device, etc. The X-ray product qualityautomatic inspection device can generate X-rays from a plurality oftargets at different positions through the distributed X-ray source, andalso matches the distributed X-ray source with the detector array. Thus,the inspected product on the factory production line can be transmittedand imaged from multiple views, a multi-view image or three-dimensionalimage can be obtained, and an all-round inspection and analysis on theproducts can be achieved. The operating states of the plurality oftargets within the distributed X-ray source can achieve fast switch ofelectrical control at the level of microsecond, enabling a highinspection speed and a high efficiency. Further, the power supply andcontrol device is provided with an image analysis subsystem, whichcompares and analyzes the inspected product image and a pre-storedstandard product image according to predetermined rules. Thus, theautomatic analysis on the inspection result of the products on theproduction line can be achieved, with a high efficiency and savedlabors. Furthermore, the power supply and control device controls thesorting device to perform corresponding actions according to the resultof the automatic analysis, and thus automatic sorting of the productscan be achieved on the production line, with a high efficiency and savedlabors.

The X-ray product quality automatic inspection device according to thepresent application can achieve an all-round inspection on the productson the factory line, can automatically analyze the inspection images,and can automatically sort the products on the production line accordingto the analysis result. The X-ray product quality automatic inspectiondevice according to the present application can operate flexibly, has astrong adaptability for different products, can inspect products roundlyand exhaustively, and has a high degree of automation. Thus, the presentinvention can significantly increase production efficiency and reduceproduction costs.

DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a structural schematic diagram of an X-ray product qualityautomatic inspection device according to some embodiments of the presentinvention.

FIG. 2 shows a cross-sectional schematic diagram of an arrangement of anX-ray source and a detector of an X-ray product quality inspectiondevice according to some embodiments of the present invention.

FIG. 3 shows a schematic diagram of an arrangement of an X-ray sourceand a detector which surrounds an inspected product according to someembodiments of the present invention.

FIG. 4 shows a schematic diagram of field angles of X-rays from an X-raysource to any point of an inspected product and field angles of theX-rays from the point to a detector according to some embodiments of thepresent invention.

FIG. 5 shows a schematic diagram of a configuration of a power supplyand control device according to some embodiments of the presentinvention.

FIG. 6 shows a cross-sectional schematic diagram of an arrangement of anX-ray source and a detector of an X-ray product quality inspectiondevice according to some embodiments of the present invention, in whichtargets of the X-ray source are arranged on a spiral line.

FIG. 7 shows a cross-sectional schematic diagram of an arrangement of anX-ray source and a detector of an X-ray product quality inspectiondevice according to some embodiments of the present invention, in whichtargets of the X-ray source are arranged on an arc.

DETAILED DESCRIPTION

By studying and analyzing the Patent Documents 1-4, the inventor of thepresent application finds the following problems. Patent Document 1 canonly obtain a plane image of inspected product. The image misses depthinformation in the X-ray radiation direction, and thus the inspection isnot an “all-round” inspection and the inspection effect is limited. Theinspection speed in Patent Document 2 is low due to the need forlocating, rotating and continuously imaging of each product, and isdifficult to match the production speed requirement of production lines.In Patent Document 3, since the effective view range of the productswith respective to the X-ray source and the detector during the movementof products is limited, the quality of obtained image has a poorthree-dimensional effect and the efficiency is low. In Patent Document4, although the “all-round” inspection is achieved, the amount of viewsis small and the effect of the “all-round” inspection is limited if thenumber of the X-ray sources is small. If the number of the X-ray sourcesis increased, the image quality can be improved while the costs will bemultiplied.

In contrast, an X-ray product quality inspection device according to oneaspect of the present application can obtain multi-view image orthree-dimensional image. Moreover, an X-ray product quality inspectiondevice according to one aspect of the present application also canobtain image of high quality. Furthermore, an X-ray product qualityinspection device according to one aspect of the present applicationalso can have high inspection efficiency and match the production speedrequirement of production lines.

In the following description, the present invention will be described indetail by reference to the accompany drawings.

FIG. 1 shows a structural schematic diagram of an X-ray product qualityautomatic inspection device according to some embodiments of the presentinvention. As shown in FIG. 1, the X-ray product quality automaticinspection device according to the present invention includes an X-raysource 1, a detector 2, a transport device 3, and a power supply andcontrol device 4. The X-ray source 1 is a distributed X-ray source thathas a plurality of targets, and can generate X-rays from multiplepositions. The detector 2 is used to receive the X-rays generated by theX-ray source, and to output signals representing the characteristics ofthe X-rays. The transport device 3 is located between the X-ray source 1and the detector 2, for carrying an inspected product 6 to pass throughan X-ray radiation region (that is, a region that is irradiated by theX-rays from the X-ray source 1). However, the transport device 3 is notlimited to the above way, and can be embodied in other ways as long asit can make the inspected product 6 pass through the X-ray radiationregion. The power supply and control device 4 can generatecharacteristic information of the inspected product 6 according to thesignal from the detector 2. The type of the characteristic informationcan be, for example, of images, threshold ranges, gas or liquid, etc.Specifically, the power supply and control device 4 may include a powersource subsystem 41 which supplies power to the X-ray source 1, thedetector 2, etc. of the X-ray product quality inspection device, acontrol subsystem 42 which performs logic control to various parts ofthe X-ray product quality inspection device and enables a normaloperation of the system, and an image construction subsystem 43 whichreceives the signal outputted from the detector 2 and forms an imagereflecting the characteristics of the inspected product 6 (that is, theimage expresses the characteristic information of the inspected product)via process of internal electronic circuit processing, softwarealgorithm analysis and image reconstruction, etc. However, the structureof the power supply and control device 4 is not limited to this, and canbe embodied as other structure as long as it can achieve theabove-described functions. In the present invention, the power supplyand control device 4 may include a characteristic analysis module, whichcan give out an inspection and analysis result of the inspected productaccording to the obtained characteristic information of the inspectedproduct.

Furthermore, the X-ray source 1 is a distributed X-ray source which hasa plurality of targets and can generate X-rays from a plurality ofpositions. The timings by which each target generates the X-ray can beflexibly controlled. The arrangement of the targets in the X-ray sourcemay be of straight line, polyline, arc, the combinations thereof, etc.The targets are arranged in such a direction as to surround (or surroundin a certain angular range) the inspected product. The arrangementdirection of the plurality of targets in the X-ray source may beperpendicular to a moving direction of the inspected product.Furthermore, it is also possible to arrange the plurality of targets inan arc shape (FIG. 7) or a spiral shape (FIG. 6) along the movingdirection of the inspected product 6. In this application, thearrangement of the plurality of targets in the X-ray source 1 is notparticularly limited.

Further, the detector 2 is a linear detector array constituted by aplurality of detection elements, and the linear detector array includesone-dimensional linear array and two-dimensional matrix array. Thearrangement of the detector array corresponds to that of the targets ofthe X-ray source, and the detector array is configured to surround theinspected product 6. Two-dimensional transmission image(s) of one sliceor more than 2 slices of the inspected product 6 can be generatedaccording to the information obtained by the detector 2 each time wheneach target generates X-ray. Further, the detector 2 may be a flat paneldetector having a plurality of detection units, and two-dimensionaltransmission images of the inspected product 6 can be generatedaccording to the information obtained by the detector 2 each time wheneach target generates X-ray. When the detector 2 is a flat paneldetector, a higher image resolution can be obtained. However, thepresent invention is not limited to this, and any other detector may beapplied to the X-ray product quality inspection device of the presentinvention, as long as it can receive the X-ray from the distributedX-ray source and convert the received X-ray into the signal forgenerating the image of the inspected product. Further, in the casewhere the detector 2 is in an array configuration, the arrangement ofthe detector array is not limited to be parallel to the X-ray source 1,and also may be perpendicular to the X-ray source 1 or correspond to theX-ray source 1 in any angle. Further, in the case where the detectorarray is perpendicular to the X-ray source 1, it is preferable that thedetector array is in a shape of arc, the center of which is any one ofthe targets.

Further, as shown in FIG. 1, the transport device 3 is located betweenthe X-ray source 1 and the detector 2, for carrying the inspectedproduct 6 to pass through the X-ray radiation region. The transportdevice 3 may be an independent transporting segment which is controlledby the X-ray product quality inspection device, and is configured as acontinuous transport mechanism which matches with the production line ofthe inspected product 6 and is arranged between standard productionlines of a factory. The inspected product 6 is transported (unloaded) tothe transport device 3 from an upstream standard production line, andthe transport device 3 carries the inspected product 6 to pass throughthe X-ray radiation region and then transports (loads) the inspectedproduct 6 to a downstream standard production line. Further, thetransport device 3 also may be a part of the standard production line ofthe factory. Of course, the transport device 3 also may be at the end ofthe standard production line, so that the inspected product 6 isdetected before leaving the line.

Further, the image construction subsystem 43 receives the signalsoutputted from the detector 2 and forms images reflecting thecharacteristics of the inspected product 6 via various processes, suchas internal electronic circuit processing, software algorithm analysis,image reconstruction, etc. X-rays generated by each target of the X-raysource 1 penetrate through the inspected product 6 and are received bythe array of the detector 2. The image construction subsystem 43 canform a transmission image of the inspected product 6 along a slicedirection within a certain slice thickness, according to the signaloutputted from the detector 2. The slice thickness is related to numberof rows in the array of the detector 2. That is, the more rows thedetector 2 has, the thicker the slice generated by each imaging is.After the targets at different positions of the X-ray source 1 generateX-rays sequentially and quickly (the time period during which eachtarget emits X-rays may be at the level of microsecond, for example, 100μs), it is possible to obtain multiple transmission images in differentdirections for the same slice (since the time period during which allthe targets sequentially emit the X-rays is at the level of microsecond,for example, a total of 1 ms for 10 targets; and the distance movedacross by the inspected product 6 during this time period is very smalland the transmission images can be regarded as belonging to the sameslice). These transmission images can form a two-dimensional slice imagecontaining detailed information of the slice by image reconstruction. Aseries of slice images of the inspected product 6 are formed as theinspected product 6 continuously moves forward when it is carried by thetransport device 3. The image construction subsystem 43 superimposes theseries of slice images and forms a complete three-dimensional image ofthe inspected product 6.

During the above-mentioned process, each row in the detector arraycorresponds to a transverse slice. The more rows the detector array has,the larger the number of the slices obtained is when the targets of theX-ray source 1 generate X-rays each time, the larger the inspectedthickness is, the faster the moving speed of the inspected product 6carried by the transport device 3 is, and thus the faster the inspectingspeed of the X-ray product quality inspection device is. When thedetector 2 is a flat panel detector (that is, an area array), thedetector 2 has a larger width. When the targets of the X-ray source 1generate the X-rays merely for one cycle, the complete three-dimensionalimage of the inspected product 6 can be obtained.

FIG. 2 shows a cross-sectional schematic diagram of an arrangement ofthe X-ray source and the detector of the X-ray product qualityinspection device according to some embodiments of the presentinvention. As shown in FIG. 2, various targets of the X-ray source 1 arearranged in linear manner, and the X-ray source 1 is disposed above thetransport device 3 (including the inspected product 6 positioned on thetransport device 3). The distribution width (the size in the left-rightdirection in FIG. 2) of the plurality of targets is larger than thewidth of the inspected product 6. The detector 2 is in a linear arrayconfiguration, and arranged below the transport device 3. The row length(the size in the left-right direction in FIG. 2) of the detector arrayis also larger than the width of the inspected product 6. X-raysgenerated by each target of the X-ray source 1 penetrate through theinspected product 6, and then are received by the detector array. Thetransmission images with different views can be obtained. Moreover, theviews have a large distribution range, and the multi-view image obtainedfinally has good multi-level information in the depth direction of theX-ray. Further, the present invention is not limited to above-describedarrangement. Alternatively, and the variations of arrangement may bethat the X-ray source 1 is arranged below the transport device 3 whilethe detector 2 is above the transport device 3, or that the X-ray source1 is arranged on the left of the transport device 3 while the detector 2is on the right, or that the X-ray source 1 is arranged on the right ofthe transport device 3 while the detector 2 is on the left, and so on,as long as the X-rays generated by the X-ray source 1 can irradiate theinspected product 6 and can be received by the detector 2.

Further, FIG. 3 shows a schematic diagram of an arrangement according tosome embodiments of the present invention, in which the X-ray source andthe detector surround the inspected product. As shown in FIG. 3, theX-ray source 1 is in a shape of “L” which is formed by two straight linesegments (correspondingly, the targets are also arranged in the shape of“L”). Further, the detector 2 is also in a shape of “L” formed by twostraight line segments. The X-ray source 1 and the detector 2, in ajoint way, completely surround the transport device 3 and the inspectedproduct 6. For any point P on the inspected product 6, a sum of a fieldangle A of X-rays from the X-ray source 1 to the point P and a fieldangle B of X-rays from the point P to the detector 2 is larger than 180degrees. The term “field angle” means an angle range of the X-raypassing the point P. Specifically, the field angle A of the X-rays fromthe X-ray source 1 to the point P means the angle range of the X-raysemitted from the X-ray source 1 before reaching the point P, whichfurther can pass the point P and can be received by the detector 2, asshown in FIG. 4. The field angle B of X-rays from the point P to thedetector 2 means the angle range of the X-rays which have passed thepoint P and can be received by the detector 2, as shown in FIG. 4. Also,the field angle B of the X-rays from the point P to the detector 2 canbe not less than 90 degrees. Therefore, compared with the situationshown in FIG. 2, the situation shown in FIG. 3 and FIG. 4 has a largerview range, and can obtain many transmission images. A completethree-dimensional image of the inspected product 6 may be formed viareconstruction algorithms, and the structure and characteristicsinformation of every location point on the inspected product 6 can beanalyzed. This is a true “all-round” exhaustive inspection and analysis.Further, the arrangement of the X-ray source 1 and the detector 2 alsomay be in a shape of U, except for the shape L mentioned-above. Then,the variations of the arrangement also may adopt polyline with otherangles, or combinations of more line segments. Alternatively, part ofthe X-ray source 1 or the entire X-ray source 1 can be changed into anarc shape, or part of the detector 2 or the entire detector 2 can bechange into an arc shape.

Further, the power supply and control device 4 may further include animage analysis subsystem 44, which may include a storage device and animage analysis software. The storage device is used for storing standardimages (or standard characteristic information) of the inspected product6, making all the inspecting images of the inspected products 6 havingbeen inspected automatically match the actual objects on numbers andstoring them. The image analysis software is used to perform comparativeanalysis, for example, differential comparison, between the imagesgenerated by the image construction subsystem 43 for each inspectedproduct 6 and the standard images (or the standard characteristicinformation), and according to set rules, to identify whether theinspected product 6 meets specific requirements, for example, whetherthere are quality defects (such as cracks, holes, trachoma, deformation,etc.), whether the processing (such as thickness, roughness,deformation, bending structure, stamping structure) is qualified, andwhether the process (such as component assembly, welding spots, seams,joints, etc.) meets specific requirements. Further, the image analysissoftware is used for outputting the result of inspection and analysis onthe inspected product 6 in a certain form (for example, alarm signal,control instructions, etc). The image analysis subsystem 44 also may notinclude a storage device, and the standard image of the inspectedproduct 6 also may be stored in a storage device outside of the imageanalysis subsystem 44.

Further, the X-ray product quality inspection device of the presentinvention may further include a sorting device 5, which for example maybe mounted on the transport device 3, and located downstream of theX-ray source 1 and the detector 2 in the moving direction of theinspected product 6. The sorting device 5 can sort the inspectedproducts 6 according to magnitude of the signal from the detector 2 orthe inspection and analysis result on the inspected product 6 suppliedby the power supply and control device 4. That is, when the power supplyand control device 4 determines that the signal from the detector 2 doesnot fall within a predetermined threshold range (that is, the inspectedproduct 6 is unqualified), the sorting device 5 sorts out thisunqualified product. Alternatively, the sorting device 5 sorts out theinspected product 6 in the case where the inspection and analysis resulton the inspected product 6 supplied by the power supply and controldevice 4 indicates that the characteristic information of this inspectedproduct 6 is inconsistent with the standard characteristic information.Alternatively, the sorting device 5 is controlled by the controlsubsystem 42, and sorts the inspected product 6 according to the imageinspection and analysis result of the inspected product 6 given by theimage analysis subsystem 44 (that is, the result of comparison betweenthe image of the inspected product 6 formed by the image analysissubsystem 44 and the standard image). In addition, the sorting device 5has a variety of embodiments. For example, the sorting device 5 may beembodied as a mechanical grip, which can grip out the unqualifiedinspected product 6 (or inspected product having other characteristics)and put it into an unqualified product basket (or other collectingdevices), leaving qualified products continue to be operated on theproduct line. Further, the sorting device 5 can also be embodied as apushing device (for example, air supplying device used in the process ofinspecting drugs contained in medicine boxes or food contained in foodpackages) which is mounted on one side of the transport device 3, andhas an opening or a movable door on the opposing side. The pushingdevice can operate in a pneumatic, electric, hydraulic or the likemanner, push the unqualified inspected product 6 (or inspected producthaving other characteristics) on the transport device 3 out from thetransport device 3 according to the instructions from the controlsystem, leaving qualified products continue to be operated on theproduct line. Furthermore, the sorting device 5 can also be embodied asa path selection device. In this case, the transport device 3 has twoseparate paths in its downstream, and the path selection device isprovided at the fork of these paths. The path selection device receivesthe instructions from the control subsystem, and when a qualifiedinspected product 6 comes, transfers it to a standard product line sothat the qualified product continues to be operated. Meanwhile, when anunqualified inspected product 6 comes, the path selection devicetransfers the unqualified product to a defective product collectingline. Through the above-described sorting device or other sorting devicewhich can achieve the same function, the products on the production linecan be sorted according to the inspection and analysis result in thepresent invention.

Further, the X-ray product quality inspection device of the presentinvention may further include a shielding device 7, which is mounted onthe outside of the X-ray source 1 and the detector 2 and encloses theX-ray inspecting region. The shielding device 7 is used to shield theX-rays in the non-application direction generated by the X-ray source 1and to shield stray X-rays produced by the X-rays hitting on objectssuch as the inspected product 6, so that the radiation level around theX-ray product quality inspection device can reach a safe radiation leveland comply with relevant national regulations, and also ensure workersat other positions of the production line to be protected fromradiation. Generally, the shielding device 7 is made of heavy metalmaterial, for example, lead, tungsten, etc. Sometimes, a certain amountof steel also may be used for convenience of processing. However, leadis preferable. Further, to enhance the shielding effect, the shieldingdevice 7 generally encloses the transport device 3 and the inspectedproduct 6, and extends for a certain distance along the transport device3.

Further, the power supply and control device 4 can also include adisplay and operation subsystem 45, which is used to display theoperating state of the X-ray product quality inspection device, todisplay the inspection image of the inspected product 6, and to displaythe inspection and analysis result. The display and operation subsystem45 can also be used for inputting control instructions, providinghuman-machine interface, etc.

FIG. 5 is a schematic diagram of a configuration of the power supply andcontrol device 4. As shown in FIG. 5, the power supply and controldevice 4 functionally includes the power supply subsystem 41, thecontrol subsystem 42, the image construction subsystem 43, the imageanalysis subsystem 44 and the display and operation system 45. Thefunctions and roles of each subsystem are as described above. Thesesubsystems may be structurally combined together as shown in FIG. 5, orcan be configured as individual components separated from each other, aslong as the functions and roles required by the present invention can beachieved.

It shall be particularly noted that, the X-ray source 1 of the presentinvention may be a multiple-energy X-ray source, for example,dual-energy X-ray source. X-rays of different energies may be obtainedby for example setting different target materials at different targetpositions of the X-ray source 1. The target materials of the X-raysource typically comprise tungsten, molybdenum, gold, copper, and so on.Since different materials have different spectral characteristics, andtherefore X-rays generated by different target materials at the sameanode voltage have different characteristic peaks, i.e. differentenergies. X-rays of different energies also can be generated by applyingdifferent anodic high voltages to the anode at different cycles duringwhich X-ray is generated (in the case where the X-ray source hasmultiple targets, the cycle is defined as a time period during whicheach target generates X-ray for one time). The employ of themultiple-energy X-ray source improves the image quality of the X-rayproduct quality inspection device, for example, adding the function ofidentifying physical materials or other functions.

It shall be particularly noted that, the detector 2 of the presentinvention may be a dual-energy detector assembly. That is, for eachlocation point, the assembly contains both a low-energy detector whichis sensitive to the X-ray of low energy and a high-energy detector whichis sensitive to the X-ray of high energy. The detector group can obtaina high-energy image and a low-energy image at the same time, when theX-ray source generates X-rays each time. It is possible to obtain moreinformation, and to improve the quality of the final detection image ofthe inspected product.

According to the above-described contents of the description in thisapplication, as a specific embodiment, the embodiment 1 can provide anX-ray product quality automatic inspection device, which comprises: adistributed X-ray source having a plurality of targets, wherein thedistributed X-ray source can generate X-rays for radiating an inspectedproduct from the plurality of targets in a predetermined sequence; adetector for receiving the X-rays generated by the distributed X-raysource; a transporting device for carrying the inspected product to passthrough a X-ray radiation region; a power supply and control device forsupplying power to the X-ray product quality automatic inspection deviceand controlling it, wherein the power supply and control device formscharacteristic information of the inspected product according to asignal from the detector, and then provides an inspection and analysisresult of the inspected product according to the characteristicinformation.

The X-ray product quality automatic inspection device according to theembodiment 1 can inspect the products in the production site flexibly.For example, an inspection site can be specially provided to place theX-ray product quality automatic inspection device of the presentinvention, and the products unloaded from the production lines can betransferred to this special inspection site. The workers can sort outthe unqualified products in situ according to the inspection andanalysis result of the products, so as to facilitate subsequentprocessing of the products. Further, the X-ray product quality automaticinspection device is not fixedly connected with certain production line,and thus can be used in common for a plurality of production lines.Therefore, the inspection cost and space for inspecting site are saved.Further, the X-ray product quality automatic inspection device of thepresent invention can also be connected with a plurality of productionlines at the same time. For example, a collection device can be used toconnect the ends of the plurality of production lines to the X-rayproduct quality automatic inspection device at the same time, and thusthe process of transferring the products to the inspecting site isomitted.

Furthermore, the X-ray product quality automatic inspection device ofthe present invention can also have a sorting device, which is locateddownstream of the distributed X-ray source and the detector in themoving direction of the inspected product, and is used to sort theinspected products according to the signal from the detector or theinspection and analysis result from the power supply and control deviceunder the control of the power supply and control device. Therefore, amechanical and automatic sorting is achieved and thus the human cost formanual sorting is saved. Of course, manual judging the above-mentionedinspection and analysis result and manual sorting also fall within theprotective scope of the present invention.

Further, according to the contents of the description, variouscombinations or modifications can be made to the configuration of theabove-described embodiment 1, and the modified technical solutions alsofall within the protective scope of the present invention.

One embodiment of the present invention is described as above. However,the present invention is not limited to this, and the present inventionalso comprises the following specific embodiment, that is, embodiment 2.

The embodiment 2 provides an X-ray product quality online inspectiondevice, in which the structure of various components and operationprinciples are the same as the embodiment 1, except for the transportdevice 3. That is, in the embodiment 2, the transport device 3 islocated between the X-ray source 1 and the detector 2 for carrying theinspected product 6 to pass through the X-ray radiation region, and isarranged as a continuous transport mechanism which matches theproduction line of the inspected products 6.

In the embodiment 2, the transport device 3 is arranged as a continuoustransport mechanism which matches the production line of the inspectedproducts 6. This means that: (A) the transportation capacity of thetransport device 3 matches that of the production line (that is, all theinspected products 6 produced within a unit time on the production lineare carried by the transport device 3 to pass through the X-ray productquality online inspection device by which the inspection is completedand the characteristic information is obtained, without overstocking ofproduct); and (B) the movement of the inspected products 6 from theproduction line to the transport device 3, and from the transport device3 to the production line is continuous, without pause, waiting, halfwayhandling and other processes. There are various specificimplementations. For example, (1) the transport device 3 itself may be asection of the production line; (2) the transport device 3 may be a partinterposed into the production line, which has the same width and movingspeed as the production line; (3) the transport device 3 may be a partinterposed into the production line, which has a larger width but alower moving speed and can transport the same amount of products perunit time as compared to the production line; (4) the transport device 3may be a part interposed into the production line, which has a smallerwidth but a higher moving speed and can transport the same amount ofproducts per unit time as compared to the production line; and (5) thetransport device 3 may be a part interposed into the production line,which has a same width, a higher moving speed and a larger product pitchand can transport the same amount of products per unit time as comparedto the production line. Further, besides the above-mentionedimplementations (1)˜(5), other implementations also can be used, as longas the production inspection of the products on the production line canbe completed.

The workers can perform analysis on the inspected product 6 according tothe characteristic information of the inspected product 6 formed by thepower supply and control device 4, and determines for example, whetherthe product is qualified. Furthermore, the power supply and controldevice 4 can also include a characteristic analyzing module, which isable to perform for example threshold comparison of signal, differentialcomparison of image, and so on. For example, the characteristicanalyzing module automatically provides the inspection and analysisresult of the inspected product 6 (for example, whether the product isqualified, etc.) by comparison and analysis according to theabove-mentioned characteristic information of the inspected product 6.

The workers can sort the inspected products 6, for example, sorting outthe unqualified products, according to the analyzing result of theinspected products 6 provided by the power supply and control device 4.Furthermore, the X-ray product quality online inspection device of theembodiment 2 also can include a sorting device 5, which is mounted onthe transport device 3 or is arranges in a same manner as in theembodiment 1. The sorting device 5 is controlled by the power supply andcontrol device 4, and can automatically sort the inspected product 6 onthe transport device 3, for example gripping out, pushing out, divertingout the products having some characteristics, according to the analyzingresult of the inspected product 6 provided by the power supply andcontrol device 4. Here, the sorting device 5 also can use the sortingdevice described in the embodiment 1.

Further, the X-ray product quality online inspection device of theembodiment 2 also can has a shielding device as the embodiment 1, andthe structural configuration of the distributed X-ray source, thedetectors, etc also can be the same as that of the embodiment 1.

The X-ray product quality online inspection device according to theembodiment 2 can achieve the online inspection to products. As such, itis possible to start sorting the products once they are unloaded fromthe production line, or it is possible that the products are directlysorted by the workers immediately after the online inspection.

Further, according to the contents of the description, variouscombinations or modifications can be made to the configuration of theabove-described embodiment 2, and the modified technical solutions alsofall within the protective scope of the present invention.

The X-ray product quality inspection device of the present invention canachieve an all-round inspection to products on factory production lines,automatically analyze inspection images, and automatically sort productson the production lines according to the analysis result. The presentinvention can operate flexibly, has strong adaptability for differentproducts, can inspect products roundly and exhaustively, and has a highdegree of automation. Thus, the present invention can significantlyincrease production efficiency and reduce production costs.

The present invention is not limited to the contents described as aboveand also can make various combinations and modifications to the X-rayproduct quality inspection device as described above.

As described above, the present invention is illustrated, but notlimited to this. It shall be understood that, the present invention canmake various modifications within the spirit of the invention.

REFERENCE SIGN LIST

-   -   1 X-ray Source    -   2 Detector    -   3 Transport Device    -   4 Power Supply and Control Device    -   5 Sorting Device    -   6 Inspected Product    -   7 Shielding Device    -   41 Power Supply Subsystem    -   42 Control Subsystem    -   43 Image Construction Subsystem    -   44 Image Analysis Subsystem    -   45 Display and Operation Subsystem

What is claimed is:
 1. An X-ray product quality automatic inspectiondevice comprising: a distributed X-ray source having a plurality oftargets, wherein the distributed X-ray source is able to generate X-raysfor irradiating an inspected product from the plurality of targets in apredetermined sequence; a detector for receiving the X-rays generated bythe distributed X-ray source and outputting a signal representingcharacteristics of the received X-rays; a transport device for carryingthe inspected product to pass through an X-ray radiation region withoutrelative rotation of the inspected product and the distributed X-raysource; a power supply and control device which is used to supply powerto and control the X-ray product quality automatic inspection device, toform characteristic information of the inspected product according tothe signal from the detector, and to provide an inspection and analysisresult of the inspected product according to the characteristicinformation; and a sorting device, which is located downstream of thedistributed X-ray source and the detector in a moving direction of theinspected product, and is used to sort the inspected product accordingto the signal from the detector under the control of the power supplyand control device or according to the inspection and analysis resultfrom the power supply and control device under the control of the powersupply and control device, wherein a sum of a field angle of the X-raysfrom the distributed X-ray source to any point on the inspected productand a field angle of the X-rays from the point to the detector is morethan 180 degrees, wherein the plurality of targets of the distributedX-ray source are arranged on a spiral shape along the moving directionof the inspected product.
 2. The X-ray product quality automaticinspection device according to claim 1, wherein the transport device islocated between the distributed X-ray source and the detector, and isarranged as a continuous transport mechanism which has a transportationcapacity matching that of a production line for the inspected product.3. The X-ray product quality automatic inspection device according toclaim 1, wherein the power supply and control device determines whetherthe signal from the detector falls within a predetermined thresholdrange, and the sorting device sorts out the inspected product when it isdetermined that the signal from the detector does not fall within thethreshold range.
 4. The X-ray product quality automatic inspectiondevice according to claim 1, wherein the sorting device sorts out theinspected product in a case where the inspection and analysis resultfrom the power supply and control device indicates that thecharacteristic information of the inspected product is inconsistent withstandard characteristic information.
 5. The X-ray product qualityautomatic inspection device according to claim 4, wherein the powersupply and control device further comprises: an image constructionsubsystem, which is used to receive the signal from the detector to forma multi-view image or a three-dimensional image expressing thecharacteristic information of the inspected product; an image analysissubsystem, which is used to compare and analyze the inspected imageobtained by the image construction subsystem and an image of a standardproduct according to a predetermined rule, and the inspected product issorted according to the comparison and analysis result of the imageanalysis subsystem; and a display and operation subsystem for displayingat least one of: operating state of the X-ray product quality automaticinspection device, an inspection image of the inspected product, theinspection and analysis result, and inputting of control instructions.6. The X-ray product quality automatic inspection device according toclaim 1, wherein the power supply and control device further comprisesan image construction subsystem, which is used to receive the signalfrom the detector to form a multi-view image or a three-dimensionalimage expressing the characteristic information of the inspectedproduct.
 7. The X-ray product quality automatic inspection deviceaccording to claim 6, wherein the power supply and control devicefurther comprises an image analysis subsystem, which is used to compareand analyze the inspected image obtained by the image constructionsubsystem and an image of a standard product according to apredetermined rule, and the inspected product is sorted according to thecomparison and analysis result of the image analysis subsystem.
 8. TheX-ray product quality automatic inspection device according to claim 7,wherein the power supply and control device further comprises a displayand operation subsystem for displaying at least one of: operating stateof the X-ray product quality automatic inspection device, an inspectionimage of the inspected product, the inspection and analysis result, andinputting of control instructions.
 9. The X-ray product qualityautomatic inspection device according to claim 1, wherein the X-rayproduct quality automatic inspection device further comprises ashielding device, which encloses the X-ray radiation region and shieldsstray X-rays.
 10. The X-ray product quality automatic inspection deviceaccording to claim 1, wherein the detector is one of a flat paneldetector having numerous detection units, a detector having a pluralityof detection units in a one-dimensional linear array and a detectorhaving a plurality of detection units in a two-dimensional matrix array,and is able to receive the X-rays at a plurality of positions at thesame time.
 11. The X-ray product quality automatic inspection deviceaccording to claim 1, wherein the distributed X-ray source is adual-energy X-ray source.
 12. The X-ray product quality automaticinspection device according to claim 1, wherein the detector is adual-energy detector.